X-Ray Inspection Machine for Semiconductor and Analysis X-eye SF Series
- High Performance Open Tube X-Ray Inspection Machine - High Resolution High Magnification for Analysis (Max 3600x) - Auto Area Calaculation, Auto Teaching - Table AFT (Auto Focus Tracing) Function - Perfect Navigation Function (Dual Vision Function) - 6 Axis (X, Y, Y-aft, Zt, Rotation, Tilt) 3D Inspection Function - Safest Design of External Leaking Dose
- 70% Smaller & Lighter compare to RCM-5 & RCM-6 - Direct Data Transmission without Interface Unit - Measuring Temp. Accuracy +/- 1 deg celsius
New Product
Reflow Checker Wireless LAN Type RCR-60
- Based on Wireless LAN Standard - Display Data in Real Time - Measuring Temperature Accuracy is +/- 1 deg celsius
New Product:
Scanning Electron Microscopes MINI SEM.
- Fast & Easy Scanning Electron Microscope - Non-Coating Scanning Electron Microscope - Provide Excellent Resolution Images and Greater Depth of Focus - Magnification of 20~15,000X and 20~30,000X